This issue also brings an interview with Dr. Vilém Neděla, the head of Environmental Electron Microscopy of the Institute of Scientific Instruments of the CAS on the Quanta 650 FEG scanning electron microscope (SEM), which is used for high-resolution imaging and semi-quantitative X-ray microanalysis of both conductive and non-conductive specimens at nanometer resolution. and Magdaléna Selingerová.