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Creator:
Uhlířová, Ludmila
Format:
print
Type:
model:internalpart and TEXT
Language:
Czech
Rights:
http://creativecommons.org/licenses/by-nc-sa/4.0/ and policy:public
Creator:
Šimková, Gabriela
Format:
print
Type:
model:internalpart and TEXT
Language:
Czech
Rights:
http://creativecommons.org/licenses/by-nc-sa/4.0/ and policy:public
Creator:
Kraus, Jiří
Format:
print
Type:
model:internalpart and TEXT
Language:
Czech
Rights:
http://creativecommons.org/licenses/by-nc-sa/4.0/ and policy:public
Creator:
Kropáček, Luboš
Format:
print
Type:
model:internalpart and TEXT
Language:
Czech
Rights:
http://creativecommons.org/licenses/by-nc-sa/4.0/ and policy:public
Creator:
Liščák, Vladimír
Format:
print
Type:
model:internalpart and TEXT
Language:
Czech
Rights:
http://creativecommons.org/licenses/by-nc-sa/4.0/ and policy:public
Creator:
Akasaki, Isamu and Gregora, Ivan
Format:
bez média and svazek
Type:
model:article and TEXT
Subject:
životopisy , laureáti Nobelovy ceny , biographies , and Nobel Prize winners
Language:
Czech
Description:
Isamu Akasaki ; přeložil Ivan Gregora.
Rights:
http://creativecommons.org/licenses/by-nc-sa/4.0/ and policy:public
Creator:
Svobodová, Ivana and Kraus, Jiří
Format:
print
Type:
model:internalpart and TEXT
Language:
Czech
Rights:
http://creativecommons.org/licenses/by-nc-sa/4.0/ and policy:public
Creator:
Hruška, Blahoslav
Format:
print
Type:
model:internalpart and TEXT
Language:
Czech
Rights:
http://creativecommons.org/licenses/by-nc-sa/4.0/ and policy:public
Creator:
Uhlířová, Ludmila
Format:
print
Type:
model:internalpart and TEXT
Language:
Czech
Rights:
http://creativecommons.org/licenses/by-nc-sa/4.0/ and policy:public
Creator:
Ágh, Matúš and Podloucký, Jan
Format:
bez média and svazek
Type:
model:article and TEXT
Subject:
reflectance , thin film , spectrophotometer , refractive index , reflektancia , tenká vrstva , spektrofotometer , and index lomu
Language:
Czech
Description:
Here experience and results achieved by measurement and subsequent calculation of optical parameters of AlF3 thin film on SF1-glass substrate are given. and Predkladáme výsledky z merania a následných výpočtov optických parametrov tenkej vrstvy AlF3 na substráte skla SF1. K nameranému priebehu odrazivosti povrstvenej vzorky bol fitovaný simulačný model odrazivosti jednoduchej tenkej vrstvy na semi-infinitnom substráte. Výsledný priebeh indexu lomu a hrúbky vrstvy bol porovnávaný pre tri merania v rôznych spektrálnych šírkach.
Rights:
http://creativecommons.org/licenses/by-nc-sa/4.0/ and policy:public